Query_Lang-PCBFunctions_Fields_TespointTestpoint_AD

Created: 九月 02, 2015 | Updated: 八月 19, 2021 | Applies to versions: 15.1, 16.0, 16.1, 17.0, 17.1, 18.0, 18.1, 19.0, 19.1, 20.0, 20.1 and 20.2

Parent page: PCB Query Functions - Fields

Summary

Pad and via objects can be used as fabrication and/or assembly testpoints, and on the top and/or bottom of the board. This function returns pad and via objects whose Fabrication Testpoint - Top, Fabrication Testpoint - Bottom, Assembly Testpoint - Top, or Assembly Testpoint - Bottom properties comply with the Query.

Syntax

Testpoint : Boolean

Example Usage

Testpoint
Testpoint = True
Returns all pad and via objects having any of their Fabrication Testpoint - Top, Fabrication Testpoint - Bottom, Assembly Testpoint - Top, or Assembly Testpoint - Bottom properties enabled.

Not Testpoint
Testpoint = False
Returns all objects except pad and via objects having any of their Fabrication Testpoint - Top, Fabrication Testpoint - Bottom, Assembly Testpoint - Top, or Assembly Testpoint - Bottom properties enabled.

Tips

The Fabrication Testpoint - Top, Fabrication Testpoint - Bottom, Assembly Testpoint - Top, and Assembly Testpoint - Bottom properties are only defined for pad and via objects.