JTAG MAPS™ | Altium

JTAG MAPS™

Easily map boundary-scan net access and prepare your JTAG test data upfront

FAST, INTUITIVE JTAG TEST ASSESSMENT

JTAG Maps^™ is an intuitive Altium extension that allows engineers to quickly assess the test possibilities offered by the JTAG devices within their design.

Until now engineers could often spend hours manually highlighting the boundary-scan nets of a design to determine test coverage

Today the free JTAG Maps^™ for Altium extension does all this and more, freeing-up valuable time, allowing a more thorough DfT (Design for Test) process and speeding time to market.

WITH OR WITHOUT BSDL FILES

Boundary-scan device model files (BSDLs) are pivotal to any JTAG/boundary-scan process as they indicate precisely which pins can be controlled or observed by JTAG/boundary-scan. However JTAG Maps can work with or without BSDL models and includes an 'assume scan covered' option.

IMPORT AS WELL AS EXPORT

While most users will want to simply use the coverage report that JTAG Maps for Altium can provide, it is possible to import a more accurate picture. After exporting a JTAG ProVision project, the data can be sent for further analysis. A simple message file containing full fault-coverage information can then be read back into JTAG Maps for display/highlighting.

MORE INFORMATION

JTAG Maps^™:
https://www.jtag.com/en/content/jtag-maps-altium

JTAG Maps^™ is a registered trademark of JTAG Technologies and Altium claims no rights there within