Easily map boundary-scan net access and prepare your JTAG test data upfront
FAST, INTUITIVE JTAG TEST ASSESSMENT
JTAG Maps™ is an intuitive Altium extension that allows engineers to quickly assess the test possibilities offered by the JTAG devices within their design.
Until now engineers could often spend hours manually highlighting the boundary-scan nets of a design to determine test coverage
Today the free JTAG Maps™ for Altium extension does all this and more, freeing-up valuable time, allowing a more thorough DfT (Design for Test) process and speeding time to market.
With or without BSDL files
Import as well as export
Boundary-scan device model files (BSDLs) are pivotal to any JTAG/boundary-scan process as they indicate precisely which pins can be controlled or observed by JTAG/boundary-scan. However JTAG Maps can work with or without BSDL models and includes an 'assume scan covered' option.
While most users will want to simply use the coverage report that JTAG Maps for Altium can provide, it is possible to import a more accurate picture. After exporting a JTAG ProVision project, the data can be sent for further analysis. A simple message file containing full fault-coverage information can then be read back into JTAG Maps for display/highlighting.