Query_Lang-PCBFunctions_Fields_TestpointTopTestpointTop_AD
Created: 9月 02, 2015 | Updated: 8月 20, 2021
| Applies to versions: 15.1, 16.0, 16.1, 17.0, 17.1, 18.0, 18.1, 19.0, 19.1, 20.0, 20.1 and 20.2
現在、バージョン 18.1. をご覧頂いています。最新情報については、バージョン Query_Lang-PCBFunctions_Fields_TestpointTop((TestpointTop))_AD の 21 をご覧ください。
Parent page: PCB Query Functions - Fields
Summary
Pad and via objects can be used as fabrication and/or assembly testpoints, and on the top and/or bottom of the board. This function returns pad and via objects whose Fabrication Testpoint - Top or Assembly Testpoint - Top properties comply with the Query.
Syntax
TestpointTop : Boolean
Example Usage
TestpointTop
TestpointTop = True
Returns all pad and via objects whose Fabrication Testpoint - Top or Assembly Testpoint - Top properties are enabled.
Not TestpointTop
TestpointTop = False
Returns all objects except pad and via objects whose Fabrication Testpoint - Top or Assembly Testpoint - Top properties are enabled.
Tips
- The Fabrication Testpoint - Top and Assembly Testpoint - Top properties are only defined for pad and via objects.
